Taeyoung Kim received the B.S. degree in electronics engineering from Konkuk University, Seoul, Korea in 2005, the M.S. degree in electrical engineering from University of Virginia, Charlottesville, VA, USA in 2012, and Ph.D. degree in computer science from University of California, Riverside, CA, USA in 2017.
He is currently a senior software engineer at Intel Corporation, Hillsboro, OR, USA, where he is involved in electronics design automation (EDA) for signal integrity and power integrity. His current research interests modeling, simulation, and optimization for VLSI circuit reliability, signal integrity, and power integrity.
Dr. Kim has authored or co-authored more than 30 papers in scientific journals and conference proceedings. He received one best research award at ACM Ph.D. Forum at Design Automation Conference (DAC) in 2015. He is an Associate Editor of Integration, the VLSI Journal from 2017 to 2020.
Dr. Taeyoung Kim
Email: tkimva at gmail dot com
Phone: 9seven1 2zero5 2three2zero